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X-ray spectral imaging in the STEM for microelectronics failure analysis
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 998-999
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- August 2003
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Tomographic Spectral Imaging: Comprehensive 3D X-ray Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 1004-1005
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- August 2003
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Spectral imaging: Towards Quantitative X-ray Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 440-441
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- August 2002
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Spectral image analysis: Getting the most from all that data
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 648-649
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- August 2002
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Automated X-ray Spectral Image Analysis of a Large Area of a Geological Material
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1554-1555
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- August 2002
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Spectral Image Analysis: Getting The most from all That Data
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- Journal:
- Microscopy Today / Volume 10 / Issue 4 / July 2002
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-11
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- July 2002
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Automated Analysis of X-Ray Spectrum Images from the STEM
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 198-199
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- August 2001
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